Co-concentration dependence of half-metallic properties in Co-Mn-Si epitaxial films

Y. Sakuraba; N. Hirose; M. Oogane; T. Nakamura; Y. Ando; K. Takanashi

doi:10.1063/1.3330942

Co-concentration dependence of half-metallic properties in Co-Mn-Si epitaxial films

Y. Sakuraba, N. Hirose, M. Oogane, T. Nakamura, Y. Ando, K. Takanashi

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Co-enriched Co₂MnSi epitaxial films, i.e., Co _2(1+x)Mn_1-xSi_1-x (CCMS) were fabricated to investigate the Co-concentration dependence of half-metallicity in a Co-Mn-Si Heusler alloy. The tunnel magnetoresistance ratio in the magnetic tunnel junctions with a CCMS electrode slightly reduces with x from -0.02 to 0.13, then suddenly drops at x=0.20. The half-metallic gap in the G-V curve also disappears when x becomes 0.20. The multiplet structure in x-ray magnetic circular dichroism spectra around Co L-edges, implying half-metallicity of CCMS, also vanishes at x=0.20. These results consistently indicate the half-metallic nature of CCMS is destroyed when the Co atomic concentration is over 57 at. %.

Original language	English
Article number	092511
Journal	Applied Physics Letters
Volume	96
Issue number	9
DOIs	https://doi.org/10.1063/1.3330942
Publication status	Published - 2010

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Co-concentration dependence of half-metallic properties in Co-Mn-Si epitaxial films",

abstract = "Co-enriched Co2MnSi epitaxial films, i.e., Co 2(1+x)Mn1-xSi1-x (CCMS) were fabricated to investigate the Co-concentration dependence of half-metallicity in a Co-Mn-Si Heusler alloy. The tunnel magnetoresistance ratio in the magnetic tunnel junctions with a CCMS electrode slightly reduces with x from -0.02 to 0.13, then suddenly drops at x=0.20. The half-metallic gap in the G-V curve also disappears when x becomes 0.20. The multiplet structure in x-ray magnetic circular dichroism spectra around Co L-edges, implying half-metallicity of CCMS, also vanishes at x=0.20. These results consistently indicate the half-metallic nature of CCMS is destroyed when the Co atomic concentration is over 57 at. %.",

author = "Y. Sakuraba and N. Hirose and M. Oogane and T. Nakamura and Y. Ando and K. Takanashi",

note = "Funding Information: This work was supported by a Grant-in-Aid for Scientific Research in Priority Area “Creation and control of spin current” (Grant No. 19048004) and Young Scientists (B) (Grant No. 20760005) from MEXT, Japan. The XAS and XMCD measurements were performed at the BL25SU in the SPring-8 with the approval of the Japan Synchrotron Radiation Research Institute (JASRI) (Proposal No. 2007B1534).",

year = "2010",

doi = "10.1063/1.3330942",

language = "English",

volume = "96",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

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T1 - Co-concentration dependence of half-metallic properties in Co-Mn-Si epitaxial films

AU - Sakuraba, Y.

AU - Hirose, N.

AU - Oogane, M.

AU - Nakamura, T.

AU - Ando, Y.

AU - Takanashi, K.

N1 - Funding Information: This work was supported by a Grant-in-Aid for Scientific Research in Priority Area “Creation and control of spin current” (Grant No. 19048004) and Young Scientists (B) (Grant No. 20760005) from MEXT, Japan. The XAS and XMCD measurements were performed at the BL25SU in the SPring-8 with the approval of the Japan Synchrotron Radiation Research Institute (JASRI) (Proposal No. 2007B1534).

PY - 2010

Y1 - 2010

N2 - Co-enriched Co2MnSi epitaxial films, i.e., Co 2(1+x)Mn1-xSi1-x (CCMS) were fabricated to investigate the Co-concentration dependence of half-metallicity in a Co-Mn-Si Heusler alloy. The tunnel magnetoresistance ratio in the magnetic tunnel junctions with a CCMS electrode slightly reduces with x from -0.02 to 0.13, then suddenly drops at x=0.20. The half-metallic gap in the G-V curve also disappears when x becomes 0.20. The multiplet structure in x-ray magnetic circular dichroism spectra around Co L-edges, implying half-metallicity of CCMS, also vanishes at x=0.20. These results consistently indicate the half-metallic nature of CCMS is destroyed when the Co atomic concentration is over 57 at. %.

AB - Co-enriched Co2MnSi epitaxial films, i.e., Co 2(1+x)Mn1-xSi1-x (CCMS) were fabricated to investigate the Co-concentration dependence of half-metallicity in a Co-Mn-Si Heusler alloy. The tunnel magnetoresistance ratio in the magnetic tunnel junctions with a CCMS electrode slightly reduces with x from -0.02 to 0.13, then suddenly drops at x=0.20. The half-metallic gap in the G-V curve also disappears when x becomes 0.20. The multiplet structure in x-ray magnetic circular dichroism spectra around Co L-edges, implying half-metallicity of CCMS, also vanishes at x=0.20. These results consistently indicate the half-metallic nature of CCMS is destroyed when the Co atomic concentration is over 57 at. %.

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Co-concentration dependence of half-metallic properties in Co-Mn-Si epitaxial films

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