Combinatorial fabrication and cathodoluminescence properties of composition spread MHfO                         3                         :Tm                         3+                         (M = Ca, Sr and Ba) films

N. Arai; T. W. Kim; H. Kubota; Y. Matsumoto; H. Koinuma

doi:10.1016/S0169-4332(02)00349-5

Combinatorial fabrication and cathodoluminescence properties of composition spread MHfO ₃ :Tm ³⁺ (M = Ca, Sr and Ba) films

N. Arai, T. W. Kim, H. Kubota, Y. Matsumoto, H. Koinuma

Research output: Contribution to journal › Conference article › peer-review

18 Citations (Scopus)

Abstract

A series of MHfO ₃ :Tm ³⁺ (M = Ca, Sr and Ba) films were fabricated on SrTiO ₃ (0 0 1) substrate by using combinatorial pulsed laser deposition (PLD) technique. Their crystal structures and luminescence properties were characterized by the concurrent X-ray diffraction (CXRD) and by the cathodoluminescence (CL) using 5 kV electron beam, respectively. By monitoring the reflection high energy electron diffraction (RHEED) intensity oscillation, the growth of MHfO ₃ :Tm ³⁺ films were optimized to proceed in a epitaxial layer-by-layer fashion. Different from bulk powders, which had the highest CL intensity in SrHfO ₃ :Tm ³⁺ , the composition spread film of Sr _1-x Ca _x HfO ₃ :Tm ³⁺ (x = 0-1) exhibited the highest CL intensity at x = 0.7 rather than SrHfO ₃ :Tm ³⁺ (x=0). This anomalous behavior in the films is discussed in view of the stress effect from the substrate.

Original language	English
Pages (from-to)	402-405
Number of pages	4
Journal	Applied Surface Science
Volume	197-198
DOIs	https://doi.org/10.1016/S0169-4332(02)00349-5
Publication status	Published - 2002
Externally published	Yes
Event	Cola 2001 - Tsukuba, Japan Duration: 2001 Oct 1 → 2001 Oct 1

Keywords

Cathodoluminescence
Combinatorial
Epitaxial film
Phosphor
Pulsed laser deposition
Tm

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

Access to Document

10.1016/S0169-4332(02)00349-5

Cite this

Arai, N., Kim, T. W., Kubota, H., Matsumoto, Y., & Koinuma, H. (2002). Combinatorial fabrication and cathodoluminescence properties of composition spread MHfO ₃ :Tm ³⁺ (M = Ca, Sr and Ba) films Applied Surface Science, 197-198, 402-405. https://doi.org/10.1016/S0169-4332(02)00349-5

Combinatorial fabrication and cathodoluminescence properties of composition spread MHfO ₃ :Tm ³⁺ (M = Ca, Sr and Ba) films . / Arai, N.; Kim, T. W.; Kubota, H. et al.
In: Applied Surface Science, Vol. 197-198, 2002, p. 402-405.

Research output: Contribution to journal › Conference article › peer-review

Arai, N, Kim, TW, Kubota, H, Matsumoto, Y & Koinuma, H 2002, ' Combinatorial fabrication and cathodoluminescence properties of composition spread MHfO ₃ :Tm ³⁺ (M = Ca, Sr and Ba) films ', Applied Surface Science, vol. 197-198, pp. 402-405. https://doi.org/10.1016/S0169-4332(02)00349-5

Arai N, Kim TW, Kubota H, Matsumoto Y, Koinuma H. Combinatorial fabrication and cathodoluminescence properties of composition spread MHfO ₃ :Tm ³⁺ (M = Ca, Sr and Ba) films Applied Surface Science. 2002;197-198:402-405. doi: 10.1016/S0169-4332(02)00349-5

Arai, N. ; Kim, T. W. ; Kubota, H. et al. / Combinatorial fabrication and cathodoluminescence properties of composition spread MHfO ₃ :Tm ³⁺ (M = Ca, Sr and Ba) films In: Applied Surface Science. 2002 ; Vol. 197-198. pp. 402-405.

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title = " Combinatorial fabrication and cathodoluminescence properties of composition spread MHfO 3 :Tm 3+ (M = Ca, Sr and Ba) films ",

abstract = " A series of MHfO 3 :Tm 3+ (M = Ca, Sr and Ba) films were fabricated on SrTiO 3 (0 0 1) substrate by using combinatorial pulsed laser deposition (PLD) technique. Their crystal structures and luminescence properties were characterized by the concurrent X-ray diffraction (CXRD) and by the cathodoluminescence (CL) using 5 kV electron beam, respectively. By monitoring the reflection high energy electron diffraction (RHEED) intensity oscillation, the growth of MHfO 3 :Tm 3+ films were optimized to proceed in a epitaxial layer-by-layer fashion. Different from bulk powders, which had the highest CL intensity in SrHfO 3 :Tm 3+ , the composition spread film of Sr 1-x Ca x HfO 3 :Tm 3+ (x = 0-1) exhibited the highest CL intensity at x = 0.7 rather than SrHfO 3 :Tm 3+ (x=0). This anomalous behavior in the films is discussed in view of the stress effect from the substrate.",

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author = "N. Arai and Kim, {T. W.} and H. Kubota and Y. Matsumoto and H. Koinuma",

note = "Funding Information: This work was supported in part by CREST-JST and COMET-STA projects. The authors thank Mitsubishi Chemical Corporation and Phosphor R&D Department, Kasei Optonix Ltd. for the measurements of the CL property. ; Cola 2001 ; Conference date: 01-10-2001 Through 01-10-2001",

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AU - Arai, N.

AU - Kim, T. W.

AU - Kubota, H.

AU - Matsumoto, Y.

AU - Koinuma, H.

N1 - Funding Information: This work was supported in part by CREST-JST and COMET-STA projects. The authors thank Mitsubishi Chemical Corporation and Phosphor R&D Department, Kasei Optonix Ltd. for the measurements of the CL property.

PY - 2002

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N2 - A series of MHfO 3 :Tm 3+ (M = Ca, Sr and Ba) films were fabricated on SrTiO 3 (0 0 1) substrate by using combinatorial pulsed laser deposition (PLD) technique. Their crystal structures and luminescence properties were characterized by the concurrent X-ray diffraction (CXRD) and by the cathodoluminescence (CL) using 5 kV electron beam, respectively. By monitoring the reflection high energy electron diffraction (RHEED) intensity oscillation, the growth of MHfO 3 :Tm 3+ films were optimized to proceed in a epitaxial layer-by-layer fashion. Different from bulk powders, which had the highest CL intensity in SrHfO 3 :Tm 3+ , the composition spread film of Sr 1-x Ca x HfO 3 :Tm 3+ (x = 0-1) exhibited the highest CL intensity at x = 0.7 rather than SrHfO 3 :Tm 3+ (x=0). This anomalous behavior in the films is discussed in view of the stress effect from the substrate.

AB - A series of MHfO 3 :Tm 3+ (M = Ca, Sr and Ba) films were fabricated on SrTiO 3 (0 0 1) substrate by using combinatorial pulsed laser deposition (PLD) technique. Their crystal structures and luminescence properties were characterized by the concurrent X-ray diffraction (CXRD) and by the cathodoluminescence (CL) using 5 kV electron beam, respectively. By monitoring the reflection high energy electron diffraction (RHEED) intensity oscillation, the growth of MHfO 3 :Tm 3+ films were optimized to proceed in a epitaxial layer-by-layer fashion. Different from bulk powders, which had the highest CL intensity in SrHfO 3 :Tm 3+ , the composition spread film of Sr 1-x Ca x HfO 3 :Tm 3+ (x = 0-1) exhibited the highest CL intensity at x = 0.7 rather than SrHfO 3 :Tm 3+ (x=0). This anomalous behavior in the films is discussed in view of the stress effect from the substrate.

KW - Cathodoluminescence

KW - Combinatorial

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KW - Phosphor

KW - Pulsed laser deposition

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