Combinatorial in situ growth-and-analysis with synchrotron radiation of thin films for oxide electronics

M. Oshima, H. Kumigashira, K. Horiba, T. Ohnishi, M. Lippmaa, M. Kawasaki, H. Koinuma

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

We have developed a combinatorial in situ growth-and-analysis system combining thin film growths by laser molecular beam epitaxy (MBE) with synchrotron radiation photoemission spectroscopy and X-ray absorption spectroscopy to investigate electronic structures of strongly correlated oxide systems, especially La1-xSrxMnO3 (LSMO) for tunneling magnetoresistance device applications. For combinatorial high-throughput analysis, we have developed a computer-controlled manipulator. The usefulness of combinatorial in situ analysis was verified by resonant photoemission and angle-resolved photoemission spectroscopy of Mn 3d e g derived majority band of compositional spread LSMO with various Sr compositions and thickness-dependent core-level shifts reflecting band bending.

Original languageEnglish
Title of host publicationSYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publicationNinth International Conference on Synchrotron Radiation Instrumentation
Pages1667-1670
Number of pages4
DOIs
Publication statusPublished - 2007
EventSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
Duration: 2006 May 282006 Jun 28

Publication series

NameAIP Conference Proceedings
Volume879
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
Country/TerritoryKorea, Republic of
CityDaegu
Period06/5/2806/6/28

Keywords

  • Combinatorial growth and analysis
  • Laser MBE
  • Oxide electronics
  • Photoemission spectroscopy

Fingerprint

Dive into the research topics of 'Combinatorial in situ growth-and-analysis with synchrotron radiation of thin films for oxide electronics'. Together they form a unique fingerprint.

Cite this