To predict the secondary electron emission coefficient (γ value) for Xe+, the reasonable treatment of surface trap levels is required. Then we introduced two characters of surface traps into the computational γ estimation method. The estimated γ values agreed with experimental results quantitatively. A larger number of trapped electrons can increase the γ value because they possess higher energy than valence electrons. Additionally, we suggest that wall charges on protecting layer surface should relate to the trap density and hence γ value.
|Number of pages||4|
|Publication status||Published - 2009|
|Event||16th International Display Workshops, IDW '09 - Miyazaki, Japan|
Duration: 2009 Dec 9 → 2009 Dec 11
|Conference||16th International Display Workshops, IDW '09|
|Period||09/12/9 → 09/12/11|