Computational study for designing high γ protecting layer: Development of a novel γ estimation method based on quantum chemistry

K. Serizawa, H. Onuma, H. Kikuchi, K. Suesada, M. Kitagaki, I. Yamashita, A. Suzuki, H. Tsuboi, N. Hatakeyama, A. Endou, H. Takaba, M. Kubo, H. Kajiyama, A. Miyamoto

Research output: Contribution to conferencePaperpeer-review

4 Citations (Scopus)

Abstract

To predict the secondary electron emission coefficient (γ value) for Xe+, the reasonable treatment of surface trap levels is required. Then we introduced two characters of surface traps into the computational γ estimation method. The estimated γ values agreed with experimental results quantitatively. A larger number of trapped electrons can increase the γ value because they possess higher energy than valence electrons. Additionally, we suggest that wall charges on protecting layer surface should relate to the trap density and hence γ value.

Original languageEnglish
Pages1949-1952
Number of pages4
Publication statusPublished - 2009
Event16th International Display Workshops, IDW '09 - Miyazaki, Japan
Duration: 2009 Dec 92009 Dec 11

Conference

Conference16th International Display Workshops, IDW '09
Country/TerritoryJapan
CityMiyazaki
Period09/12/909/12/11

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