Concentration dependence of the Neel temperature of γ-phase Mn100-xRux alloys

K. Sasao, R. Yamauchi, K. Fukamichi, H. Yamauchi

Research output: Contribution to journalConference articlepeer-review

Abstract

In this study, concentration dependence of the Neel temperature of γ-Mn100-xRux alloys was measured using a VSM from 300 K to 100 K and the electrical resistivity was measured by a four-probe method in the same temperature range. The results lead to the conclusion that the Neel temperature becomes higher with decreasing the number of 3d electrons in the Mn site.

Original languageEnglish
Pages (from-to)DS-01
JournalDigests of the Intermag Conference
Publication statusPublished - 1999 Dec 1
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: 1999 May 181999 May 21

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Concentration dependence of the Neel temperature of γ-phase Mn100-xRux alloys'. Together they form a unique fingerprint.

Cite this