Convergent-beam electron diffraction

Michiyoshi Tanaka; Kenji Tsuda

doi:10.1093/jmicro/dfr038

Convergent-beam electron diffraction

Michiyoshi Tanaka, Kenji Tsuda

IMRAM - Division of Measurements

Tohoku University

Research output: Contribution to journal › Article › peer-review

44 Citations (Scopus)

Abstract

This paper reviews the convergent-beam electron diffraction (CBED) technique. Point- and space-group determination methods of ordinary crystals are described, along with an example of the determination method for Sr3Ru2O7. The symmetry determination of one-dimensionally incommensurate crystals and quasicrystals is explained. The large-angle CBED technique, which is indispensable for lattice defect and lattice strain analysis, is also described. A real procedure for lattice strain analysis is provided, using an example of a multilayer Si _1-xGe _x/Si material. A nanometer-scale crystal structure refinement method and charge density and crystal potential determination method by CBED are briefly described.

Original language	English
Pages (from-to)	S245-S267
Journal	Journal of Electron Microscopy
Volume	60
Issue number	SUPPL. 1
DOIs	https://doi.org/10.1093/jmicro/dfr038
Publication status	Published - 2011 Aug

Keywords

CBED
lattice defects
point groups
space groups
strain analysis
structure analysis

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10.1093/jmicro/dfr038

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AB - This paper reviews the convergent-beam electron diffraction (CBED) technique. Point- and space-group determination methods of ordinary crystals are described, along with an example of the determination method for Sr3Ru2O7. The symmetry determination of one-dimensionally incommensurate crystals and quasicrystals is explained. The large-angle CBED technique, which is indispensable for lattice defect and lattice strain analysis, is also described. A real procedure for lattice strain analysis is provided, using an example of a multilayer Si 1-xGe x/Si material. A nanometer-scale crystal structure refinement method and charge density and crystal potential determination method by CBED are briefly described.

KW - CBED

KW - lattice defects

KW - point groups

KW - space groups

KW - strain analysis

KW - structure analysis

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Convergent-beam electron diffraction

Abstract

Keywords

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