Critical angle behavior of exchange bias and coercivity in CoFe/MnIr bilayers

Dong Young Kim; Cheolgi Kim; Chong Oh Kim; M. Naka; M. Tsunoda; M. Takahashi

doi:10.1109/TMAG.2006.879756

Critical angle behavior of exchange bias and coercivity in CoFe/MnIr bilayers

Dong Young Kim, Cheolgi Kim, Chong Oh Kim, M. Naka, M. Tsunoda, M. Takahashi

Research Center for Green X-Tech

Research output: Contribution to journal › Article › peer-review

Abstract

Angular dependence of H_ex and H_c, and the critical angle behavior are measured in CoFe/MnIr bilayers annealed at 200°C and 340°C. The interfacial exchange coupling anisotropy and the antiferromagnet anisotropy at t_AF < t_AF^c are estimated from the best fitting of angular dependence of H_ex and H_c using Stoner-Wohlfarth (S-W) model. These results confirm existence of interfacial exchange coupling anisotropy between F and AF layers for t_AF < t_AF^c. The measured critical angles for t_AF > t_AF^c as well as for t_AF < t _AF^c are well explained using S-W model.

Original language	English
Pages (from-to)	3011-3013
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	42
Issue number	10
DOIs	https://doi.org/10.1109/TMAG.2006.879756
Publication status	Published - 2006 Oct

Keywords

Critical AF thickness
Critical angle
Exchange bias and coercivity
Stoner-Wohlfarth model

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title = "Critical angle behavior of exchange bias and coercivity in CoFe/MnIr bilayers",

abstract = "Angular dependence of Hex and Hc, and the critical angle behavior are measured in CoFe/MnIr bilayers annealed at 200°C and 340°C. The interfacial exchange coupling anisotropy and the antiferromagnet anisotropy at tAF < tAFc are estimated from the best fitting of angular dependence of Hex and Hc using Stoner-Wohlfarth (S-W) model. These results confirm existence of interfacial exchange coupling anisotropy between F and AF layers for tAF < tAFc. The measured critical angles for tAF > tAFc as well as for tAF < t AFc are well explained using S-W model.",

keywords = "Critical AF thickness, Critical angle, Exchange bias and coercivity, Stoner-Wohlfarth model",

author = "Kim, {Dong Young} and Cheolgi Kim and Kim, {Chong Oh} and M. Naka and M. Tsunoda and M. Takahashi",

note = "Funding Information: This work was supported by the KoSEF through the Re-CAMM, Chungnam National University.",

year = "2006",

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doi = "10.1109/TMAG.2006.879756",

language = "English",

volume = "42",

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journal = "IEEE Transactions on Magnetics",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

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TY - JOUR

T1 - Critical angle behavior of exchange bias and coercivity in CoFe/MnIr bilayers

AU - Kim, Dong Young

AU - Kim, Cheolgi

AU - Kim, Chong Oh

AU - Naka, M.

AU - Tsunoda, M.

AU - Takahashi, M.

N1 - Funding Information: This work was supported by the KoSEF through the Re-CAMM, Chungnam National University.

PY - 2006/10

Y1 - 2006/10

N2 - Angular dependence of Hex and Hc, and the critical angle behavior are measured in CoFe/MnIr bilayers annealed at 200°C and 340°C. The interfacial exchange coupling anisotropy and the antiferromagnet anisotropy at tAF < tAFc are estimated from the best fitting of angular dependence of Hex and Hc using Stoner-Wohlfarth (S-W) model. These results confirm existence of interfacial exchange coupling anisotropy between F and AF layers for tAF < tAFc. The measured critical angles for tAF > tAFc as well as for tAF < t AFc are well explained using S-W model.

AB - Angular dependence of Hex and Hc, and the critical angle behavior are measured in CoFe/MnIr bilayers annealed at 200°C and 340°C. The interfacial exchange coupling anisotropy and the antiferromagnet anisotropy at tAF < tAFc are estimated from the best fitting of angular dependence of Hex and Hc using Stoner-Wohlfarth (S-W) model. These results confirm existence of interfacial exchange coupling anisotropy between F and AF layers for tAF < tAFc. The measured critical angles for tAF > tAFc as well as for tAF < t AFc are well explained using S-W model.

KW - Critical AF thickness

KW - Critical angle

KW - Exchange bias and coercivity

KW - Stoner-Wohlfarth model

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JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

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Critical angle behavior of exchange bias and coercivity in CoFe/MnIr bilayers

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Keywords

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