Abstract
Al-substituted langasite (La3Ga5-xAlxSiO14) single crystals up to x = 0.9 have been grown by the Czochralski method. The effective segregation coefficient (keff) of A1 in langasite was estimated to be between 1.03 and 1.07. X-ray structural analysis indicated that A1 occupied the octahedral and the two kinds of tetrahedral sites in the crystal lattice. The piezoelectricity of A1-substituted langasite was also compared with that of langasite. By A1 substitution, while the piezoelectric constant |d11\ became slightly larger, d14 was smaller. The electromechanical coupling factors (k12, k25 and k26) became larger. It was found that A1 substitution of langasite created a material with preferred electromechanical properties applicable to the next generation of advanced digital communication systems.
Original language | English |
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Pages (from-to) | 289-293 |
Number of pages | 5 |
Journal | Journal of Crystal Growth |
Volume | 229 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2001 Jul 2 |
Keywords
- A1. Characterization
- A2. Czochralski method
- A2. Single crystal growth
- B1. Oxides
- B2. Piezoelectric materials
- B3. Filters
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry