TY - JOUR
T1 - Crystal growth and piezoelectric properties of Ca3Ta(Ga1−x Scx)3Si2O14 single crystals
AU - Igarashi, Yu
AU - Ohashi, Yuji
AU - Yokota, Yuui
AU - Arakawa, Mototaka
AU - Inoue, Kenji
AU - Yamaji, Akihiro
AU - Shoji, Yasuhiro
AU - Kamada, Kei
AU - Kurosawa, Shunsuke
AU - Yoshikawa, Akira
N1 - Funding Information:
This work was supported by Japan Science and Technology Agency (JST), Adaptable and Seamless Technology transfer Program through Target-driven R&D (A-STEP) Grant number AS272S003a.
Publisher Copyright:
© 2017 Elsevier Ltd and Techna Group S.r.l.
PY - 2017/8
Y1 - 2017/8
N2 - Ca3Ta(Ga1-xScx)3Si2O14 (CTGSS) single crystals with various Sc concentrations (x = 0, 0.1, 0.2, 0.3, and 0.4) were grown by the micro-pulling-down method and their structure and chemical composition were evaluated. Through the powder X-ray diffraction (XRD) measurement and backscattered electron (BSE) imaging, it was demonstrated that all the CTGSS crystals with different Sc concentration were successfully grown as langasite-type structure although some secondary phases were observed for the crystals with x = 0.2, 0.3 and 0.4. Lattice parameters calculated from the powder XRD pattern generally increased with Sc substitution. Measured parameters for CTGSS crystal with x = 0.1 were larger permittivity ε11T/ε0 and lower electromechanical coupling coefficient k12 and piezoelectric constant d11 than those for CTGS crystal with x = 0. It was also suggested that piezoelectric constant |d14| became larger due to the Sc substitution.
AB - Ca3Ta(Ga1-xScx)3Si2O14 (CTGSS) single crystals with various Sc concentrations (x = 0, 0.1, 0.2, 0.3, and 0.4) were grown by the micro-pulling-down method and their structure and chemical composition were evaluated. Through the powder X-ray diffraction (XRD) measurement and backscattered electron (BSE) imaging, it was demonstrated that all the CTGSS crystals with different Sc concentration were successfully grown as langasite-type structure although some secondary phases were observed for the crystals with x = 0.2, 0.3 and 0.4. Lattice parameters calculated from the powder XRD pattern generally increased with Sc substitution. Measured parameters for CTGSS crystal with x = 0.1 were larger permittivity ε11T/ε0 and lower electromechanical coupling coefficient k12 and piezoelectric constant d11 than those for CTGS crystal with x = 0. It was also suggested that piezoelectric constant |d14| became larger due to the Sc substitution.
KW - Piezoelectric properties
KW - Single crystal
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U2 - 10.1016/j.ceramint.2017.05.272
DO - 10.1016/j.ceramint.2017.05.272
M3 - Article
AN - SCOPUS:85020414969
SN - 0272-8842
VL - 43
SP - S136-S139
JO - Ceramics International
JF - Ceramics International
ER -