Crystal growth, dielectric and polarization reversal properties of bi4ti3oi2 single crystal

Yoichiro Masuda, Hiroshi Masumoto, Akira Baba, Takashi Goto, Toshio Hirai

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78 Citations (Scopus)

Abstract

A Lii203T102 phase diagram was determined using differential thermal analysis (DTA) apparatus. Iii4Ti30, 2 (BIT) micalike single crystals grown by a flux method were clear and slightly grayish in color. Ferroelectric and dielectric properties of BIT crystals were observed from measurements of electric displacement vs electric field hysteresis loops and the dielectric constant. Also, the polarization switching characteristics of BIT crystals were investigated. The switching time and switching current density were read from the transient waveforms.

Original languageEnglish
Pages (from-to)3108-3112
Number of pages5
JournalJapanese Journal of Applied Physics
Volume31
Issue number9S
DOIs
Publication statusPublished - 1992 Sept

Keywords

  • BiTi0
  • Domain wall
  • Ferroelectric
  • Flux method
  • Layer structure
  • Polarization reversal

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