Crystal structure analysis using annular Dark-Field imaging with high precision

K. Kimoto, K. Ishizuka, M. Saito, T. Nagai, X. Yu, R. J. Xie, N. Hirosaki, Y. Matsui

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)468-469
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
Publication statusPublished - 2009 Jul
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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