Abstract
The crystallization mechanism and kinetics of Cr2Ge2Te6 (CrGT) films were investigated by differential scanning calorimetry. The average Avrami exponent (na) analysis indicated that CrGT exhibits a growth-dominant crystallization in the range of heating rate (β) of 10-50°C/min. In comparison, Ge2Sb2Te5 (GST) showed a nucleation-dominant crystallization. The na of CrGT was about 3, and was majorly independent of β. The na of GST decreased with an increasing β, which asymptotically approached a value of around 3. The kinetic constant of CrGT was evaluated to be almost the same with that of GST, indicating that CrGT undergoes fast crystallization.
Original language | English |
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Pages (from-to) | 1167-1172 |
Number of pages | 6 |
Journal | MRS Communications |
Volume | 8 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2018 Sept 1 |
ASJC Scopus subject areas
- Materials Science(all)