CControlled Creep Experiment Using Microcomputer

Genki Yagawa, Hidetoshi Hashizume, Toshihiko Fukuda, Masazou Kurosawa

Research output: Contribution to journalArticlepeer-review


The C 7-integral) control creep expreiment' system was developed using microcomputer. The system was applied to the Cconstant control creep test of type 304 stainless steel CT specimen at 550°C. The test result showd that the C was successfully controlled in elevated temperature test with the developed system and the crack growth rate was almost constant under the secondary creep region and C constant condition.

Original languageEnglish
Pages (from-to)254-257
Number of pages4
JournalNihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A
Issue number461
Publication statusPublished - 1985


  • C (Modified J-Integral)
  • Crack Growth Rate
  • Creep
  • Electric Potential Method
  • Material Testing


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