Dark-field X-ray ptychography: Towards high-resolution imaging of thick and unstained biological specimens

Akihiro Suzuki; Kei Shimomura; Makoto Hirose; Nicolas Burdet; Yukio Takahashi

doi:10.1038/srep35060

Dark-field X-ray ptychography: Towards high-resolution imaging of thick and unstained biological specimens

Akihiro Suzuki, Kei Shimomura, Makoto Hirose, Nicolas Burdet, Yukio Takahashi

SRIS - Cross Fertilization Division

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

The phase shift of light or electrons in objects is now necessary for probing weak-phase objects such as unstained biological specimens. Optical microscopy (OM) and transmission electron microscopy (TEM) have been used to observe weak-phase objects. However, conventional OM has low spatial resolution and TEM is limited to thin specimens. Here, we report on the development of dark-field X-ray ptychography, which combines X-ray ptychography and X-ray in-line holography, to observe weak-phase objects with a phase resolution better than 0.01 rad, a spatial resolution better than 15 nm, and a field of view larger than 5 μm. We apply this method to the observation of both the outline and magnetosomes of the magnetotactic bacteria MO-1. Observation of thick samples with high resolution is expected to find broad applications in not only biology but also materials science.

Original language	English
Article number	35060
Journal	Scientific Reports
Volume	6
DOIs	https://doi.org/10.1038/srep35060
Publication status	Published - 2016 Oct 13

Access to Document

10.1038/srep35060

Cite this

@article{bd2e83d5064f4006bf291308bb94fea3,

title = "Dark-field X-ray ptychography: Towards high-resolution imaging of thick and unstained biological specimens",

abstract = "The phase shift of light or electrons in objects is now necessary for probing weak-phase objects such as unstained biological specimens. Optical microscopy (OM) and transmission electron microscopy (TEM) have been used to observe weak-phase objects. However, conventional OM has low spatial resolution and TEM is limited to thin specimens. Here, we report on the development of dark-field X-ray ptychography, which combines X-ray ptychography and X-ray in-line holography, to observe weak-phase objects with a phase resolution better than 0.01 rad, a spatial resolution better than 15 nm, and a field of view larger than 5 μm. We apply this method to the observation of both the outline and magnetosomes of the magnetotactic bacteria MO-1. Observation of thick samples with high resolution is expected to find broad applications in not only biology but also materials science.",

author = "Akihiro Suzuki and Kei Shimomura and Makoto Hirose and Nicolas Burdet and Yukio Takahashi",

note = "Funding Information: This work was supported by the SENTAN Project of JST, KAKENHI (Grant Nos JP25709057, JP26600143, and JP26106515) and JSPS Fellows (Grant No. 252959), and the X-ray Free Electron Laser Priority Strategy Program of MEXT. Publisher Copyright: {\textcopyright} The Author(s) 2016.",

year = "2016",

month = oct,

day = "13",

doi = "10.1038/srep35060",

language = "English",

volume = "6",

journal = "Scientific Reports",

issn = "2045-2322",

publisher = "Nature Publishing Group",

}

TY - JOUR

T1 - Dark-field X-ray ptychography

T2 - Towards high-resolution imaging of thick and unstained biological specimens

AU - Suzuki, Akihiro

AU - Shimomura, Kei

AU - Hirose, Makoto

AU - Burdet, Nicolas

AU - Takahashi, Yukio

N1 - Funding Information: This work was supported by the SENTAN Project of JST, KAKENHI (Grant Nos JP25709057, JP26600143, and JP26106515) and JSPS Fellows (Grant No. 252959), and the X-ray Free Electron Laser Priority Strategy Program of MEXT. Publisher Copyright: © The Author(s) 2016.

PY - 2016/10/13

Y1 - 2016/10/13

N2 - The phase shift of light or electrons in objects is now necessary for probing weak-phase objects such as unstained biological specimens. Optical microscopy (OM) and transmission electron microscopy (TEM) have been used to observe weak-phase objects. However, conventional OM has low spatial resolution and TEM is limited to thin specimens. Here, we report on the development of dark-field X-ray ptychography, which combines X-ray ptychography and X-ray in-line holography, to observe weak-phase objects with a phase resolution better than 0.01 rad, a spatial resolution better than 15 nm, and a field of view larger than 5 μm. We apply this method to the observation of both the outline and magnetosomes of the magnetotactic bacteria MO-1. Observation of thick samples with high resolution is expected to find broad applications in not only biology but also materials science.

AB - The phase shift of light or electrons in objects is now necessary for probing weak-phase objects such as unstained biological specimens. Optical microscopy (OM) and transmission electron microscopy (TEM) have been used to observe weak-phase objects. However, conventional OM has low spatial resolution and TEM is limited to thin specimens. Here, we report on the development of dark-field X-ray ptychography, which combines X-ray ptychography and X-ray in-line holography, to observe weak-phase objects with a phase resolution better than 0.01 rad, a spatial resolution better than 15 nm, and a field of view larger than 5 μm. We apply this method to the observation of both the outline and magnetosomes of the magnetotactic bacteria MO-1. Observation of thick samples with high resolution is expected to find broad applications in not only biology but also materials science.

UR - http://www.scopus.com/inward/record.url?scp=84991738179&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84991738179&partnerID=8YFLogxK

U2 - 10.1038/srep35060

DO - 10.1038/srep35060

M3 - Article

C2 - 27734961

AN - SCOPUS:84991738179

SN - 2045-2322

VL - 6

JO - Scientific Reports

JF - Scientific Reports

M1 - 35060

ER -

Dark-field X-ray ptychography: Towards high-resolution imaging of thick and unstained biological specimens

Abstract

Access to Document

Other files and links

Fingerprint

Cite this