TY - JOUR
T1 - Debris-free laser-assisted low-stress dicing for multi-layered MEMS - Separation method of glass layer
AU - Izawa, Yusaku
AU - Tsurumi, Yosuke
AU - Tanaka, Shuji
AU - Kikuchi, Hideyuki
AU - Sueda, Keichi
AU - Nakata, Yoshiki
AU - Esashi, Masayoshi
AU - Miyanaga, Noriaki
AU - Fujita, Masayuki
PY - 2008
Y1 - 2008
N2 - We have investigated the novel debris-free in-air laser dicing technology for glass. The target wafer was a soda lime glass and a Pyrex glass with the thickness of 1 mm. Our technology combines two processes, which was a dicing guide fabrication and a wafer separation process. First process was the internal transformation using a fundamental wavelength of a Ti:Sapphire laser or a Nd:YAG laser. The pulse width of each laser was 100 fs and 10 ns. The threshold energy for the internal transformation (NA-0.7 focusing) was 3 μJ and 65 μJ, respectively. The second process was a thermally-induced crack propagation using CO2 laser or a mechanical bending separation by pressing a blade. The internal transformation fabricated in first process worked sufficiently as the guide of separation, the dicing line completely followed the internal transformation. The diced cross-section was sharp and free from chipping. In addition, neither debris nor damages were found on the surface after laser dicing.
AB - We have investigated the novel debris-free in-air laser dicing technology for glass. The target wafer was a soda lime glass and a Pyrex glass with the thickness of 1 mm. Our technology combines two processes, which was a dicing guide fabrication and a wafer separation process. First process was the internal transformation using a fundamental wavelength of a Ti:Sapphire laser or a Nd:YAG laser. The pulse width of each laser was 100 fs and 10 ns. The threshold energy for the internal transformation (NA-0.7 focusing) was 3 μJ and 65 μJ, respectively. The second process was a thermally-induced crack propagation using CO2 laser or a mechanical bending separation by pressing a blade. The internal transformation fabricated in first process worked sufficiently as the guide of separation, the dicing line completely followed the internal transformation. The diced cross-section was sharp and free from chipping. In addition, neither debris nor damages were found on the surface after laser dicing.
KW - Debris-free laser dicing
KW - Glass
KW - Internal transformation
KW - MEMS
KW - Noncontact wafer separation
KW - Thermal stress
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U2 - 10.1541/ieejsmas.128.91
DO - 10.1541/ieejsmas.128.91
M3 - Article
AN - SCOPUS:65649105730
SN - 1341-8939
VL - 128
SP - 91
EP - 96
JO - IEEJ Transactions on Sensors and Micromachines
JF - IEEJ Transactions on Sensors and Micromachines
IS - 3
ER -