Current transients of a titanium microelectrode corresponding to an impingement of a single zirconia particle were measured in a buffer solution. It was found that the repassivation after a particle impact followed high field model of oxide growth. The apparent repassivation rate evaluated by the relation between the charge and the peak height of a current transient showed dependence on applied potential, and the apparent repassivation rate increased with increase of potential. The influence of potential applied passivation prior to particle impingement on the apparent repassivation rate was more predominant than that of the potential applied during impingement of relatively large particle. This indicates that the apparent repassivation rate does not represent the actual repassivation kinetics. It is suggested that the passive film formed prior to a particle impact and repassivation give rise to resistance against surface deformation and film breakdown, and that it affects the apparent repassivation behavior. copyright The Electrochemical Society.