TY - JOUR
T1 - Dependence of exchange bias field on composition of stabilizing layer and sputtering process in synthetic ferrimagnetic coupled media
AU - Djayaprawira, D. D.
AU - Komiyama, K.
AU - Yoshimura, S.
AU - Michalke, T.
AU - Takahashi, M.
PY - 2002/2
Y1 - 2002/2
N2 - The examination of the effect of exchange field Hex on media properties and the dependence of Hex on composition of stabilizing layers and sputtering process in SF media was presented. Non-textured NiP/Al substrate was used to grow the SF media by DC magnetron sputtering method. The results revealed that to increase Hex, it was necessary to reduce the interface roughness and increase the saturation magnetization of the ferromagnetic layers.
AB - The examination of the effect of exchange field Hex on media properties and the dependence of Hex on composition of stabilizing layers and sputtering process in SF media was presented. Non-textured NiP/Al substrate was used to grow the SF media by DC magnetron sputtering method. The results revealed that to increase Hex, it was necessary to reduce the interface roughness and increase the saturation magnetization of the ferromagnetic layers.
KW - Antiferromagnetic coupling
KW - Longitudinal thin film media
KW - Magnetic recording
KW - Synthetic ferrimagnetic
KW - Thermal decay
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U2 - 10.1016/S0304-8853(01)00632-1
DO - 10.1016/S0304-8853(01)00632-1
M3 - Article
AN - SCOPUS:0036466014
SN - 0304-8853
VL - 239
SP - 396
EP - 398
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
IS - 1-3
ER -