Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction

T. A. Merz, H. Noad, R. Xu, H. Inoue, W. Liu, Y. Hikita, A. Vailionis, K. A. Moler, H. Y. Hwang

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)


We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.

Original languageEnglish
Article number182901
JournalApplied Physics Letters
Issue number18
Publication statusPublished - 2016 May 2
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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