Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction

T. A. Merz; H. Noad; R. Xu; H. Inoue; W. Liu; Y. Hikita; A. Vailionis; K. A. Moler; H. Y. Hwang

doi:10.1063/1.4948351

Depth resolved domain mapping in tetragonal SrTiO₃ by micro-Laue diffraction

T. A. Merz, H. Noad, R. Xu, H. Inoue, W. Liu, Y. Hikita, A. Vailionis, K. A. Moler, H. Y. Hwang

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO₃. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.

Original language	English
Article number	182901
Journal	Applied Physics Letters
Volume	108
Issue number	18
DOIs	https://doi.org/10.1063/1.4948351
Publication status	Published - 2016 May 2
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.4948351

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title = "Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction",

abstract = "We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.",

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T1 - Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction

AU - Merz, T. A.

AU - Noad, H.

AU - Xu, R.

AU - Inoue, H.

AU - Liu, W.

AU - Hikita, Y.

AU - Vailionis, A.

AU - Moler, K. A.

AU - Hwang, H. Y.

PY - 2016/5/2

Y1 - 2016/5/2

N2 - We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.

AB - We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.

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Depth resolved domain mapping in tetragonal SrTiO₃ by micro-Laue diffraction

Abstract

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