Abstract
We demonstrate the use of a Fourier Transform Infrared microscope system to detect and measure electroreflectance (ER) from mid-infrared quantum cascade laser (QCL) device. To characterize intersubband transition (ISBT) energies in a functioning QCL device, a microscope is used to focus the probe on the QCL cleaved mirror. The measured ER spectra exhibit resonance features associated to ISBTs under applied electric field in agreement with the numerical calculations and comparable to observed photocurrent, and emission peaks. The method demonstrates the potential as a characterization tool for QCL devices.
Original language | English |
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Article number | 231106 |
Journal | Applied Physics Letters |
Volume | 103 |
Issue number | 23 |
DOIs | |
Publication status | Published - 2013 Dec 2 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)