A semi-quantitative method is proposed for determining the thickness of a covering layer on a solid. The thickness is calculated from the intensity ratios between Auger electron spectra (AES) and core-electron energy-loss spectra (ELS) for the uncovered and covered surfaces. This method needs no standard sample or ion sputtering to estimate the thickness, although it involves a number of assumptions. It has been applied to the determination of the thickness of segregated phosphorus layers on intergranular fracture planes of FeP alloys, using a cylindrical-mirror electron analyzer.
|Number of pages
|Journal of Electron Spectroscopy and Related Phenomena
|Published - 1981