Development of 3D imaging systems using ion microbeams

Shigeo Matsuyama, Taisuke Hatakeyama, Hirotsugu Arai, Yohei Kikuchi, Misako Miwa, Sho Toyama

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


Elemental analysis of specimens at the microscale is very important in various fields. To capture a three-dimensional (3D) elemental image, we developed a sequential computed tomography (CT) system comprising particle-induced X-ray emission (PIXE)-micron-CT and PIXE-CT. This system can image samples with sizes ranging from several µm to 1000 µm. We applied this system to capture 3D elemental images of iron (Fe), titanium (Ti) and cesium (Cs) in samples ranging in size from 50 to 100 µm. Ti and Fe were easily measured by both micron-CT and PIXE-CT, and the results obtained were consistent between the two systems.

Original languageEnglish
Pages (from-to)31-36
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Publication statusPublished - 2020 Nov 1


Dive into the research topics of 'Development of 3D imaging systems using ion microbeams'. Together they form a unique fingerprint.

Cite this