TY - JOUR
T1 - Development of a high energy resolution electron energy-loss spectroscopy microscope
AU - Terauchi, M.
AU - Tanaka, M.
AU - Tsuno, K.
AU - Ishida, M.
PY - 1999
Y1 - 1999
N2 - We have developed a high energy resolution electron energy-loss spectroscopy (EELS) microscope, which can take spectra from specified small specimen areas and specified small reciprocal space areas to investigate detailed electronic structures. The EELS microscope is equipped with retarding Wien filters as the monochromator and the analyser. The filters are designed to achieve a stigmatic focus. The energy resolutions are 12 meV and 25 meV for cases without and with a specimen, respectively. Spatial and momentum resolutions are 30-110 nm in diameter and 1.1 nm-1 in angular diameter, respectively. EELS spectra are presented to show the performance of this instrument.
AB - We have developed a high energy resolution electron energy-loss spectroscopy (EELS) microscope, which can take spectra from specified small specimen areas and specified small reciprocal space areas to investigate detailed electronic structures. The EELS microscope is equipped with retarding Wien filters as the monochromator and the analyser. The filters are designed to achieve a stigmatic focus. The energy resolutions are 12 meV and 25 meV for cases without and with a specimen, respectively. Spatial and momentum resolutions are 30-110 nm in diameter and 1.1 nm-1 in angular diameter, respectively. EELS spectra are presented to show the performance of this instrument.
KW - Band gap energy
KW - Core exciton of diamond
KW - Density of states of a- rhombohedral boron
KW - Electron energy-loss spectroscopy microscope
KW - High energy- resolution, retardation
KW - Stigmatic focus
KW - Wien filter
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U2 - 10.1046/j.1365-2818.1999.00450.x
DO - 10.1046/j.1365-2818.1999.00450.x
M3 - Article
AN - SCOPUS:0032966614
SN - 0022-2720
VL - 194
SP - 203
EP - 209
JO - Journal of Microscopy
JF - Journal of Microscopy
IS - 1
ER -