A new detection apparatus for both low energy X-rays like 1 keV and back scattered protons of MeV energy was developed. The detection apparatus consists of a large-solid-angle multi-device Si detector and a data acquisition system. The detector has 45 detection devices which are arranged in the shape of a pentagonal pyramid and fully cover a sample. A micro-beam irradiates the sample through the center of the pentagonal pyramid and X-rays emitted from the sample are detected in a solid angle of about 1.0 sr. This novel detection setup has about five times higher sensitivity than a conventional micro-PIXE camera. In addition, not only X-rays but back scattered protons can be detected, since the counting rate of back scattered protons per detection device is small despite lack of a passive absorber.
|Number of pages||4|
|Journal||Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms|
|Publication status||Published - 2003 Sept|
|Event||8th International Conference on Nuclear Microprobe Technology - Takasaki, Japan|
Duration: 2002 Sept 8 → 2002 Sept 13
- Data acquisition system
- Semiconductor detector