Development of a large-solid-angle and multi-device detection system for elemental analysis

T. Satoh, K. Ishii, T. Kamiya, T. Sakai, M. Oikawa, K. Arakawa, S. Matsuyama, H. Yamazaki

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)


A new detection apparatus for both low energy X-rays like 1 keV and back scattered protons of MeV energy was developed. The detection apparatus consists of a large-solid-angle multi-device Si detector and a data acquisition system. The detector has 45 detection devices which are arranged in the shape of a pentagonal pyramid and fully cover a sample. A micro-beam irradiates the sample through the center of the pentagonal pyramid and X-rays emitted from the sample are detected in a solid angle of about 1.0 sr. This novel detection setup has about five times higher sensitivity than a conventional micro-PIXE camera. In addition, not only X-rays but back scattered protons can be detected, since the counting rate of back scattered protons per detection device is small despite lack of a passive absorber.

Original languageEnglish
Pages (from-to)113-116
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Publication statusPublished - 2003 Sept
Event8th International Conference on Nuclear Microprobe Technology - Takasaki, Japan
Duration: 2002 Sept 82002 Sept 13


  • Data acquisition system
  • Micro-PIXE
  • RBS
  • Semiconductor detector


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