TY - JOUR
T1 - Development of a large-solid-angle and multi-device detection system for elemental analysis
AU - Satoh, T.
AU - Ishii, K.
AU - Kamiya, T.
AU - Sakai, T.
AU - Oikawa, M.
AU - Arakawa, K.
AU - Matsuyama, S.
AU - Yamazaki, H.
PY - 2003/9
Y1 - 2003/9
N2 - A new detection apparatus for both low energy X-rays like 1 keV and back scattered protons of MeV energy was developed. The detection apparatus consists of a large-solid-angle multi-device Si detector and a data acquisition system. The detector has 45 detection devices which are arranged in the shape of a pentagonal pyramid and fully cover a sample. A micro-beam irradiates the sample through the center of the pentagonal pyramid and X-rays emitted from the sample are detected in a solid angle of about 1.0 sr. This novel detection setup has about five times higher sensitivity than a conventional micro-PIXE camera. In addition, not only X-rays but back scattered protons can be detected, since the counting rate of back scattered protons per detection device is small despite lack of a passive absorber.
AB - A new detection apparatus for both low energy X-rays like 1 keV and back scattered protons of MeV energy was developed. The detection apparatus consists of a large-solid-angle multi-device Si detector and a data acquisition system. The detector has 45 detection devices which are arranged in the shape of a pentagonal pyramid and fully cover a sample. A micro-beam irradiates the sample through the center of the pentagonal pyramid and X-rays emitted from the sample are detected in a solid angle of about 1.0 sr. This novel detection setup has about five times higher sensitivity than a conventional micro-PIXE camera. In addition, not only X-rays but back scattered protons can be detected, since the counting rate of back scattered protons per detection device is small despite lack of a passive absorber.
KW - Data acquisition system
KW - Micro-PIXE
KW - RBS
KW - Semiconductor detector
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U2 - 10.1016/S0168-583X(03)01053-X
DO - 10.1016/S0168-583X(03)01053-X
M3 - Conference article
AN - SCOPUS:0043014938
SN - 0168-583X
VL - 210
SP - 113
EP - 116
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
T2 - 8th International Conference on Nuclear Microprobe Technology
Y2 - 8 September 2002 through 13 September 2002
ER -