TY - GEN
T1 - Development of a laser scan method to decrease hidden areas caused by objects like pole at whole 3-D shape measurement
AU - Hata, Akihiko
AU - Ohno, Kazunori
AU - Takeuchi, Eijiro
AU - Tadokoro, Satoshi
AU - Sakurada, Ken
AU - Miyahra, Naoki
AU - Higashi, Kazuyuki
PY - 2010
Y1 - 2010
N2 - The authors are researching about Three dimensional mapping using mobile robot and 3-D laser scanner. We developed 3-D laser scanner which can measure whole 3-D shape with a combination of 2-D laser scanner and Pan-Tilt base. However, measuring surrounding areas using the scanner on mobile robot, there are some areas where can't measure whole 3-D shape caused by overview camera and wireless LAN's aerial mounted on a robot. In this paper, 3-D laser scanner can measure uniform and whole 3-D shape, which tilts constant value around pitch axis and then rotates one revolution around yaw axis. We propose measuring method that decrease effects of hidden objects by making offset between 2-D laser scan plane and pitch axis.
AB - The authors are researching about Three dimensional mapping using mobile robot and 3-D laser scanner. We developed 3-D laser scanner which can measure whole 3-D shape with a combination of 2-D laser scanner and Pan-Tilt base. However, measuring surrounding areas using the scanner on mobile robot, there are some areas where can't measure whole 3-D shape caused by overview camera and wireless LAN's aerial mounted on a robot. In this paper, 3-D laser scanner can measure uniform and whole 3-D shape, which tilts constant value around pitch axis and then rotates one revolution around yaw axis. We propose measuring method that decrease effects of hidden objects by making offset between 2-D laser scan plane and pitch axis.
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U2 - 10.1109/SII.2010.5708365
DO - 10.1109/SII.2010.5708365
M3 - Conference contribution
AN - SCOPUS:79952806185
SN - 9781424493159
T3 - 2010 IEEE/SICE International Symposium on System Integration: SI International 2010 - The 3rd Symposium on System Integration, SII 2010, Proceedings
SP - 436
EP - 441
BT - 2010 IEEE/SICE International Symposium on System Integration
T2 - 3rd International Symposium on System Integration, SII 2010
Y2 - 21 December 2010 through 22 December 2010
ER -