TY - JOUR
T1 - Development of a new holographic method with resonant X-ray scattering
AU - Takahashi, Y.
AU - Hayashi, K.
AU - Matsubara, E.
N1 - Funding Information:
One of the authors (Y.T.) would like to thank the Research Fellowships of the Japan Society for the Promotion of Scientists for financial support. Part of this work was financially supported by the Industrial Technology Research Grant Program in 2000 from the New Energy and Industrial Development Organization (NEDO) of Japan, a Grant-in-aid for Scientific Research on Priority Areas (B)(2) ‘Localized Quantum Structures’ (No. 12130201) and for young scientist (No. 15686025), and the 21st century COE program on ‘International Center of Research and Education of Materials’ from the Ministry of Education, Culture, Sports, Science and Technology (MECSST). The synchrotron radiation experiments were performed at SPring-8 with the approval of Japan Synchrotron Radiation Research Institute (JASRI) as Nanotechnology Support Project of MECSST (Proposal No. 2003A0406-NS2-np).
PY - 2003/9
Y1 - 2003/9
N2 - Complex X-ray holography (CXH) using resonant scattering is proposed as a new atomic resolution holography method. CXH provides us a solution for the twin-image problem as well as elemental identification in real space. Accurate differences among intensities recorded at several X-ray energies around an absorption edge must be experimentally obtained in the CXH method. Taking into account that the holographic signal is of the order of 0.1% of its background, we find it difficult to carry out using ordinary technique for hologram measurement. Thus, in order to measure holograms with a very good S/N ratio, a sample was cooled about 100 K and fluorescent X-rays were focused on a detector with a cylindrical graphite analyzer in the X-ray fluorescence holography apparatus at SPring-8. Ga fluorescent holograms of GaAs were recorded at energies near the As K absorption edge. A change of holographic oscillations due to the resonant scattering, which is expected from the computer simulation, was firstly observed.
AB - Complex X-ray holography (CXH) using resonant scattering is proposed as a new atomic resolution holography method. CXH provides us a solution for the twin-image problem as well as elemental identification in real space. Accurate differences among intensities recorded at several X-ray energies around an absorption edge must be experimentally obtained in the CXH method. Taking into account that the holographic signal is of the order of 0.1% of its background, we find it difficult to carry out using ordinary technique for hologram measurement. Thus, in order to measure holograms with a very good S/N ratio, a sample was cooled about 100 K and fluorescent X-rays were focused on a detector with a cylindrical graphite analyzer in the X-ray fluorescence holography apparatus at SPring-8. Ga fluorescent holograms of GaAs were recorded at energies near the As K absorption edge. A change of holographic oscillations due to the resonant scattering, which is expected from the computer simulation, was firstly observed.
KW - GaAs
KW - Local structure
KW - X-ray fluorescence holography
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U2 - 10.1016/j.stam.2003.10.001
DO - 10.1016/j.stam.2003.10.001
M3 - Article
AN - SCOPUS:0347602014
SN - 1468-6996
VL - 4
SP - 409
EP - 414
JO - Science and Technology of Advanced Materials
JF - Science and Technology of Advanced Materials
IS - 5
ER -