Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals

Takayuki Muro; Yukako Kato; Tomohiro Matsushita; Toyohiko Kinoshita; Yoshio Watanabe; Hiroyuki Okazaki; Takayoshi Yokoya; Akira Sekiyama; Shigemasa Suga

doi:10.1107/S0909049511034418

Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals

Takayuki Muro, Yukako Kato, Tomohiro Matsushita, Toyohiko Kinoshita, Yoshio Watanabe, Hiroyuki Okazaki, Takayoshi Yokoya, Akira Sekiyama, Shigemasa Suga

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 m has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 μm × 65 μm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 μm × 100 μm × 80 μm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.

Original language	English
Pages (from-to)	879-884
Number of pages	6
Journal	Journal of Synchrotron Radiation
Volume	18
Issue number	6
DOIs	https://doi.org/10.1107/S0909049511034418
Publication status	Published - 2011 Nov

Keywords

angle-resolved photoemission spectroscopy (ARPES)
microcleaving
micropositioning
small crystal
soft X-ray

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Instrumentation

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10.1107/S0909049511034418

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title = "Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals",

abstract = "A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 m has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 μm × 65 μm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 μm × 100 μm × 80 μm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.",

keywords = "angle-resolved photoemission spectroscopy (ARPES), microcleaving, micropositioning, small crystal, soft X-ray",

author = "Takayuki Muro and Yukako Kato and Tomohiro Matsushita and Toyohiko Kinoshita and Yoshio Watanabe and Hiroyuki Okazaki and Takayoshi Yokoya and Akira Sekiyama and Shigemasa Suga",

year = "2011",

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doi = "10.1107/S0909049511034418",

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AU - Muro, Takayuki

AU - Kato, Yukako

AU - Matsushita, Tomohiro

AU - Kinoshita, Toyohiko

AU - Watanabe, Yoshio

AU - Okazaki, Hiroyuki

AU - Yokoya, Takayoshi

AU - Sekiyama, Akira

AU - Suga, Shigemasa

PY - 2011/11

Y1 - 2011/11

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AB - A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 m has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 μm × 65 μm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 μm × 100 μm × 80 μm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.

KW - angle-resolved photoemission spectroscopy (ARPES)

KW - microcleaving

KW - micropositioning

KW - small crystal

KW - soft X-ray

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Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals

Abstract

Keywords

ASJC Scopus subject areas

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