TY - JOUR
T1 - Development of a sub-eV resolution soft-X-ray spectrometer for a transmission electron microscope
AU - Terauchi, Masami
AU - Yamamoto, Hideto
AU - Tanaka, Michiyoshi
N1 - Funding Information:
The authors thank Mr F. Sato and technical staff of the Research Institute for Scientific Measurements (RISM), Tohoku University, for their skilful technical assistance. We also thank Dr M. Yanagihara of RISM, Tohoku University, for his useful suggestions. The present work was partly supported by a Grant-in-Aid for Scientific Research on the Basic Research (No. 12440079) and the Priority Area ‘Fullerenes and nanotubes’ (No. 11165204) from the Ministry of Education, Science, Sports and Culture of Japan.
PY - 2001
Y1 - 2001
N2 - We constructed a grazing-incidence soft-X-ray spectrometer for a transmission electron microscope. The spectrometer, which was composed of a grating and a CCD detector, was attached to a JEM2000FX transmission electron microscope. B K-emission spectra of hexagonal boron-nitride, which give the density of states of the valence band of the material, were obtained with an energy resolution of about 0.6 eV.
AB - We constructed a grazing-incidence soft-X-ray spectrometer for a transmission electron microscope. The spectrometer, which was composed of a grating and a CCD detector, was attached to a JEM2000FX transmission electron microscope. B K-emission spectra of hexagonal boron-nitride, which give the density of states of the valence band of the material, were obtained with an energy resolution of about 0.6 eV.
KW - B K-emission spectra
KW - DOS of the valence band
KW - Hexagonal boron-nitride
KW - Soft-X-ray spectrometer
KW - Transmission electron microscope
KW - X-ray emission spectroscopy
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U2 - 10.1093/jmicro/50.2.101
DO - 10.1093/jmicro/50.2.101
M3 - Article
C2 - 11347710
AN - SCOPUS:0035023310
SN - 0022-0744
VL - 50
SP - 101
EP - 104
JO - Journal of Electron Microscopy
JF - Journal of Electron Microscopy
IS - 2
ER -