Abstract
We have developed an X-band filter utilizing air-gap-type film bulk acoustic resonators (FBARs). The air-gap structure is simple and cost-effective. Results from both simulations and experiments demonstrate that a dome-shaped air gap was formed between the substrate surface and the bottom electrode and that an air-gap-type FBAR structure was possible. The air gap can be formed on the flat substrate using stress control of piezoelectric and metal films without using a thick sacrificial layer. As a result, the fabricated X-band FBAR operated successfully with a keff2 of 6.30%, a resonance Q of 246, and an antiresonance Q of 462. The fabricated filter had a center frequency of 9.07 GHz, a fractional bandwidth of 3.1% and a minimum insertion loss of 1.7 dB.
Original language | English |
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Pages (from-to) | 4007-4010 |
Number of pages | 4 |
Journal | Japanese journal of applied physics |
Volume | 47 |
Issue number | 5 PART 2 |
DOIs | |
Publication status | Published - 2008 May 23 |
Keywords
- Air-gap
- Bulk acoustic wave (BAW)
- Coupling factor (K )
- Film bulk acoustic resonator (FBAR)
- Mobile communication
- Piezoelectric thin-film resonator
- Q factor
- Solidly mounted resonator (SMR)
- Surface acoustic wave (SAW)
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)