Development of fast scanning microscopic XAFS measurement system

T. Tsuji, T. Uruga, K. Nitta, N. Kawamura, M. Mizumaki, M. Suzuki, O. Sekizawa, N. Ishiguro, M. Tada, H. Ohashi, H. Yamazaki, H. Yumoto, T. Koyama, Y. Senba, T. Takeuchi, Y. Terada, N. Nariyama, K. Takeshita, A. Fujiwara, S. GotoM. Yamamoto, M. Takata, T. Ishikawa

Research output: Contribution to journalConference articlepeer-review

5 Citations (Scopus)


We have developed a fast scanning microscopic X-ray absorption fine-structure (XAFS) measurement system using a 100-300 nm focused X-ray beam at the BL39XU nano-scale analysis station at SPring-8. This system provides two-dimensional XAFS images constructed from X-ray fluorescence (XRF) images measured by fast continuous 2-dimensional scanning at all XAFS measurement energies. High-quality XAFS spectra at each position were obtained by correcting shift in the XRF images. We applied our proposed method to measuring single catalyst particles, and succeeded in measuring the microscopic x-ray absorption near-edge structure (XANES) images that were 2-4 μm square with a spatial resolution of 300 nm.

Original languageEnglish
Article number012019
JournalJournal of Physics: Conference Series
Issue number1
Publication statusPublished - 2013
Event15th International Conference on X-Ray Absorption Fine Structure, XAFS 2012 - Beijing, China
Duration: 2012 Jul 222012 Jul 28


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