Development of fast scanning microscopic XAFS measurement system

T. Tsuji, T. Uruga, K. Nitta, N. Kawamura, M. Mizumaki, M. Suzuki, O. Sekizawa, N. Ishiguro, M. Tada, H. Ohashi, H. Yamazaki, H. Yumoto, T. Koyama, Y. Senba, T. Takeuchi, Y. Terada, N. Nariyama, K. Takeshita, A. Fujiwara, S. GotoM. Yamamoto, M. Takata, T. Ishikawa

Research output: Contribution to journal › Conference article › peer-review