TY - JOUR
T1 - Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy
AU - Takahashi, Yukio
AU - Kubo, Hideto
AU - Furukawa, Hayato
AU - Yamauchi, Kazuto
AU - Matsubara, Eiichiro
AU - Ishikawa, Tetsuya
AU - Nishino, Yoshinori
PY - 2009
Y1 - 2009
N2 - An incident X-ray flux monitor for coherent X-ray diffraction microscopy was developed. The intensities of x-rays passing through the sample were measured using an X-ray photodiode, with the simultaneous measurement of the X-ray diffraction intensities of the sample. As a result of the normalization of the X-ray diffraction intensities by the incident X-ray flux determined from the monitor, the fluctuation of the speckle intensities was successfully suppressed.
AB - An incident X-ray flux monitor for coherent X-ray diffraction microscopy was developed. The intensities of x-rays passing through the sample were measured using an X-ray photodiode, with the simultaneous measurement of the X-ray diffraction intensities of the sample. As a result of the normalization of the X-ray diffraction intensities by the incident X-ray flux determined from the monitor, the fluctuation of the speckle intensities was successfully suppressed.
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U2 - 10.1088/1742-6596/186/1/012060
DO - 10.1088/1742-6596/186/1/012060
M3 - Article
AN - SCOPUS:73349117798
SN - 1742-6588
VL - 186
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
M1 - 012060
ER -