@inproceedings{483e7a7fccd14eb3b788912379a5f2ad,
title = "Development of UHV-LT MFM operating in magnetic field",
abstract = "We have developed an ultrahigh-vacuum low-temperature magnetic force microscope (UHV-LT MFM) which can operate in magnetic fields. The microscope is based on a non-contact atomic force microscope using a piezoelectric cantilever. Measurements of hard disc media confirmed spatial resolution of ∼50 nm even at low temperatures down to 10 K. The maximum scanning area is as wide as 2.5 μm × 2.5 μm at 10 K and 7.5 μm × 7.5 μm at room temperature. We have also equipped the microscope with an electromagnet in order to apply external magnetic fields up to 0.25 T in the horizontal direction. The MFM head is mounted on a piezo-driven rotation stage, so that the direction of magnetic field relative to the sample surface can be set arbitrarily.",
keywords = "External field, Low temperature, MFM, Spatial resolution, UHV",
author = "Hidetaka Sugaya and Taro Hitosugi and Toshihiro Shimada and Toshihiko Nagamura and Yuji Matsumoto and Tetsuya Hasegawa",
year = "2006",
doi = "10.1063/1.2355349",
language = "English",
isbn = "0735403473",
series = "AIP Conference Proceedings",
pages = "1667--1668",
booktitle = "LOW TEMPERATURE PHYSICS",
note = "LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24 ; Conference date: 10-08-2006 Through 17-10-2006",
}