TY - JOUR
T1 - Development of X-ray-induced afterglow characterization system
AU - Yanagida, Takayuki
AU - Fujimoto, Yutaka
AU - Ito, Takashi
AU - Uchiyama, Koro
AU - Mori, Kuniyoshi
PY - 2014/6
Y1 - 2014/6
N2 - To evaluate the X-ray-induced afterglow phenomenon, we developed an ionizing-radiation-induced luminescence characterization system equipped with a pulse-width-tunable X-ray source. The system consists of a pulse X-ray tube and a detector system based on photon counting. The excitation pulse width was tunable from nano-to millisecond ranges, and the dynamic range of the X-ray-induced afterglow was 106. Conventional scintillators for X-ray CT or security systems, namely, Bi4Ge3O12, CdWO4, Tl-doped CsI, and Tb and Pr-codoped Gd2O 2S, were evaluated for the performance test. Results show that the afterglow time profiles of these scintillators are consistent with generally known results with high accuracy.
AB - To evaluate the X-ray-induced afterglow phenomenon, we developed an ionizing-radiation-induced luminescence characterization system equipped with a pulse-width-tunable X-ray source. The system consists of a pulse X-ray tube and a detector system based on photon counting. The excitation pulse width was tunable from nano-to millisecond ranges, and the dynamic range of the X-ray-induced afterglow was 106. Conventional scintillators for X-ray CT or security systems, namely, Bi4Ge3O12, CdWO4, Tl-doped CsI, and Tb and Pr-codoped Gd2O 2S, were evaluated for the performance test. Results show that the afterglow time profiles of these scintillators are consistent with generally known results with high accuracy.
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U2 - 10.7567/APEX.7.062401
DO - 10.7567/APEX.7.062401
M3 - Article
AN - SCOPUS:84904631493
SN - 1882-0778
VL - 7
JO - Applied Physics Express
JF - Applied Physics Express
IS - 6
M1 - 062401
ER -