Differential phase X-ray imaging microscopy with X-ray talbot interferometer

Yoshihiro Takeda, Wataru Yashiro, Tadashi Hattori, Akihisa Takeuchi, Yoshio Suzuki, Atsushi Momose

Research output: Contribution to journalArticlepeer-review

39 Citations (Scopus)


A new type of differential phase X-ray imaging microscopy attained by combination of an X-ray imaging microscope and an X-ray Talbot interferometer is described. An X-ray Talbot interferometer was set up so that a moiré-fringe pattern appeared on the image plane of an X-ray imaging microscope. The wavefront inclination (differential phase shift) caused by a weakly absorbing polymer sample was measured from the fringes using the fringe-scanning method and with a spatial resolution of 1 μm. Phase tomography was also performed and the internal structures of a piece of polymer blend were depicted.

Original languageEnglish
Pages (from-to)1170021-1170023
Number of pages3
JournalApplied Physics Express
Issue number11
Publication statusPublished - 2008 Nov


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