Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy

Y. Cho, K. Matsuura, N. Valanoor, R. Ramesh

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy'. Together they form a unique fingerprint.

Material Science

Physics

Engineering