Direct mapping of the far and near field optical emission of nano-sized tapered glass fibers by an integrated SNOM/SF system

Ruggero Micheletto; Ken Nakajima; Martin Geisler; Masahiko Hara; Wolfgang Knoll

doi:10.1016/S0169-4332(98)00857-5

Direct mapping of the far and near field optical emission of nano-sized tapered glass fibers by an integrated SNOM/SF system

Ruggero Micheletto, Ken Nakajima, Martin Geisler, Masahiko Hara, Wolfgang Knoll

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We describe a versatile scanning near-field optical microscope (SNOM) integrated with a shear force (SF) sample probe separation controller. The system works with special tapered optical fibers as the probing element. These fibers are fabricated by using a technique proposed earlier by Ohtsu et al. [M. Ohtsu, Optoelectronic devices and technology, 10 (2) (1995) 147]. We describe here the SNOM system we developed giving details on the fabrication of the fibers. Then we show the first direct bi-dimensional mapping of the optical emission of these tips as measured by our system in an original 2 tip configuration mode.

Original language	English
Pages (from-to)	514-519
Number of pages	6
Journal	Applied Surface Science
Volume	144-145
DOIs	https://doi.org/10.1016/S0169-4332(98)00857-5
Publication status	Published - 1999 Apr

Keywords

Optical fibers
SNOM
Shear force
Tapered fibers

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/S0169-4332(98)00857-5

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title = "Direct mapping of the far and near field optical emission of nano-sized tapered glass fibers by an integrated SNOM/SF system",

abstract = "We describe a versatile scanning near-field optical microscope (SNOM) integrated with a shear force (SF) sample probe separation controller. The system works with special tapered optical fibers as the probing element. These fibers are fabricated by using a technique proposed earlier by Ohtsu et al. [M. Ohtsu, Optoelectronic devices and technology, 10 (2) (1995) 147]. We describe here the SNOM system we developed giving details on the fabrication of the fibers. Then we show the first direct bi-dimensional mapping of the optical emission of these tips as measured by our system in an original 2 tip configuration mode.",

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author = "Ruggero Micheletto and Ken Nakajima and Martin Geisler and Masahiko Hara and Wolfgang Knoll",

year = "1999",

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doi = "10.1016/S0169-4332(98)00857-5",

language = "English",

volume = "144-145",

pages = "514--519",

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T1 - Direct mapping of the far and near field optical emission of nano-sized tapered glass fibers by an integrated SNOM/SF system

AU - Micheletto, Ruggero

AU - Nakajima, Ken

AU - Geisler, Martin

AU - Hara, Masahiko

AU - Knoll, Wolfgang

PY - 1999/4

Y1 - 1999/4

N2 - We describe a versatile scanning near-field optical microscope (SNOM) integrated with a shear force (SF) sample probe separation controller. The system works with special tapered optical fibers as the probing element. These fibers are fabricated by using a technique proposed earlier by Ohtsu et al. [M. Ohtsu, Optoelectronic devices and technology, 10 (2) (1995) 147]. We describe here the SNOM system we developed giving details on the fabrication of the fibers. Then we show the first direct bi-dimensional mapping of the optical emission of these tips as measured by our system in an original 2 tip configuration mode.

AB - We describe a versatile scanning near-field optical microscope (SNOM) integrated with a shear force (SF) sample probe separation controller. The system works with special tapered optical fibers as the probing element. These fibers are fabricated by using a technique proposed earlier by Ohtsu et al. [M. Ohtsu, Optoelectronic devices and technology, 10 (2) (1995) 147]. We describe here the SNOM system we developed giving details on the fabrication of the fibers. Then we show the first direct bi-dimensional mapping of the optical emission of these tips as measured by our system in an original 2 tip configuration mode.

KW - Optical fibers

KW - SNOM

KW - Shear force

KW - Tapered fibers

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DO - 10.1016/S0169-4332(98)00857-5

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SN - 0169-4332

VL - 144-145

SP - 514

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JO - Applied Surface Science

JF - Applied Surface Science

ER -

Direct mapping of the far and near field optical emission of nano-sized tapered glass fibers by an integrated SNOM/SF system

Abstract

Keywords

ASJC Scopus subject areas

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