Direct observation of charge transfer region at interfaces in graphene devices

Naoka Nagamura, Koji Horiba, Satoshi Toyoda, Shodai Kurosumi, Toshihiro Shinohara, Masaharu Oshima, Hirokazu Fukidome, Maki Suemitsu, Kosuke Nagashio, Akira Toriumi

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)


Nanoscale spectromicroscopic characterizing technique is indispensable for realization of future high-speed graphene transistors. Highly spatially resolved soft X-ray photoelectron microscopy measurements have been performed using our "3D nano-ESCA" (three-dimensional nanoscale electron spectroscopy for chemical analysis) equipment in order to investigate the local electronic states at interfaces in a graphene device structure. We have succeeded in detecting a charge transfer region at the graphene/metal-electrode interface, which extends over ∼500 nm with the energy difference of 60 meV. Moreover, a nondestructive depth profiling reveals the chemical properties of the graphene/SiO2-substrate interface.

Original languageEnglish
Article number241604
JournalApplied Physics Letters
Issue number24
Publication statusPublished - 2013 Jun 17


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