Direct observation of microscopic plastic deformation of stainless steel using lattice drawn by focused ion beam of Ga⁺

Visualisation of the microscopic deformation of a stainless steel was attempted. A mirror polished, flat surface specimen was subjected to a simple tension test, and the deformation of a fine lattice drawn by a focused ion beam (FIB) of Ga⁺ was observed. The depth of the lattice was of the order of a few tens of nanometres. The penetration depth of Ga⁺ was estimated using SRIM software, and the result indicated that the use of a FIB might not cause serious detriment to the mechanical properties of the lattice surface. After testing, lattices were examined by field emission scanning electron microscopy (FESEM). The results showed that displacement was continuous in the grain as well as across the grain boundary, and the microscopic deformation was categorised into three patterns: (a) a clear thin layer of shear deformation which was discontinuous across the grain boundary, (b) an area of uniform deformation inside this thin layer and (c) microscopic shear bands appearing sporadically in the grains.