DSP SYNTHESIZED SIGNAL SOURCE FOR ANALOG TESTING STIMULUS AND NEW TEST METHOD.

H. Kitayoshi; S. Sumiea; K. Siirakawa; S. Takeshita

DSP SYNTHESIZED SIGNAL SOURCE FOR ANALOG TESTING STIMULUS AND NEW TEST METHOD.

H. Kitayoshi, S. Sumiea, K. Siirakawa, S. Takeshita

ENG - Robotics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9 Citations (Scopus)

Abstract

A new testing method, associated with a new signal source optimized for FFT (fast Fourier transform) analysis, has realized the transfer function of an analog DUT (device under test) in an audio frequency band (0-100 kHz) over a wide dynamic range of 120 dB and with high precision of plus or minus 0. 002 dB and plus or minus 0. 02 degree . The method also estimated the transfer function at 400 points at speeds ranging from several tens of ms to several hundreds of ms.

Original language	English
Title of host publication	Digest of Papers - International Test Conference
Publisher	IEEE
Pages	825-834
Number of pages	10
ISBN (Print)	081860641X
Publication status	Published - 1985 Dec 1

Publication series

Name	Digest of Papers - International Test Conference
ISSN (Print)	0743-1686

ASJC Scopus subject areas

Engineering(all)

Cite this

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title = "DSP SYNTHESIZED SIGNAL SOURCE FOR ANALOG TESTING STIMULUS AND NEW TEST METHOD.",

abstract = "A new testing method, associated with a new signal source optimized for FFT (fast Fourier transform) analysis, has realized the transfer function of an analog DUT (device under test) in an audio frequency band (0-100 kHz) over a wide dynamic range of 120 dB and with high precision of plus or minus 0. 002 dB and plus or minus 0. 02 degree . The method also estimated the transfer function at 400 points at speeds ranging from several tens of ms to several hundreds of ms.",

author = "H. Kitayoshi and S. Sumiea and K. Siirakawa and S. Takeshita",

year = "1985",

month = dec,

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AU - Kitayoshi, H.

AU - Sumiea, S.

AU - Siirakawa, K.

AU - Takeshita, S.

PY - 1985/12/1

Y1 - 1985/12/1

N2 - A new testing method, associated with a new signal source optimized for FFT (fast Fourier transform) analysis, has realized the transfer function of an analog DUT (device under test) in an audio frequency band (0-100 kHz) over a wide dynamic range of 120 dB and with high precision of plus or minus 0. 002 dB and plus or minus 0. 02 degree . The method also estimated the transfer function at 400 points at speeds ranging from several tens of ms to several hundreds of ms.

AB - A new testing method, associated with a new signal source optimized for FFT (fast Fourier transform) analysis, has realized the transfer function of an analog DUT (device under test) in an audio frequency band (0-100 kHz) over a wide dynamic range of 120 dB and with high precision of plus or minus 0. 002 dB and plus or minus 0. 02 degree . The method also estimated the transfer function at 400 points at speeds ranging from several tens of ms to several hundreds of ms.

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M3 - Conference contribution

AN - SCOPUS:0022315649

SN - 081860641X

T3 - Digest of Papers - International Test Conference

SP - 825

EP - 834

BT - Digest of Papers - International Test Conference

PB - IEEE

ER -

DSP SYNTHESIZED SIGNAL SOURCE FOR ANALOG TESTING STIMULUS AND NEW TEST METHOD.

Abstract

Publication series

ASJC Scopus subject areas

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