Abstract
The progress of multiple cracking in a silicon oxide (SiOx) film deposited onto a polyethylene terephthalate (PET) substrate was analyzed statistically using Monte Carlo simulation. The finite element analysis assuming elasto-plastic behavior of the polymer substrate was conducted to calculate the stress distributions in film fragments and was used in the simulation. The Weibull parameters of the film were determined from the scatter of crack onset strains. The simulation predicted successfully the crack density and the distribution of fragment lengths during the progress of the multiple cracking. The validity of the shear lag analysis based on the unique stress criterion in the previous study was also evaluated.
| Original language | English |
|---|---|
| Pages (from-to) | 487-491 |
| Number of pages | 5 |
| Journal | Proceedings, Annual Technical Conference - Society of Vacuum Coaters |
| Publication status | Published - 2001 |
| Event | 44th Annual Technical Conference Prodeedings - Philadelphia, PA, United States Duration: 2001 Apr 21 → 2001 Apr 26 |
Keywords
- Mechanical properties
- Permeation barrier coatings
- SiO
- Weibull analysis