Dynamic mode force microscopy for the detection of lateral and vertical electrostatic forces

S. Watanabe; K. Hane; M. Ito; T. Goto

doi:10.1063/1.110437

Dynamic mode force microscopy for the detection of lateral and vertical electrostatic forces

S. Watanabe, K. Hane, M. Ito, T. Goto

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

In this letter, a variant of scanning force microscope for detecting attractive forces is reported. The force gradients of the attractive forces acting in two orthogonal directions were detected simultaneously from the resonant frequency shifts of a cantilever oscillating in two directions. Using the fine electrode sample, the distributions of the electrostatic forces acting in lateral and vertical directions were visualized separately.

Original language	English
Pages (from-to)	2573-2575
Number of pages	3
Journal	Applied Physics Letters
Volume	63
Issue number	18
DOIs	https://doi.org/10.1063/1.110437
Publication status	Published - 1993
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.110437

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title = "Dynamic mode force microscopy for the detection of lateral and vertical electrostatic forces",

abstract = "In this letter, a variant of scanning force microscope for detecting attractive forces is reported. The force gradients of the attractive forces acting in two orthogonal directions were detected simultaneously from the resonant frequency shifts of a cantilever oscillating in two directions. Using the fine electrode sample, the distributions of the electrostatic forces acting in lateral and vertical directions were visualized separately.",

author = "S. Watanabe and K. Hane and M. Ito and T. Goto",

year = "1993",

doi = "10.1063/1.110437",

language = "English",

volume = "63",

pages = "2573--2575",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

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T1 - Dynamic mode force microscopy for the detection of lateral and vertical electrostatic forces

AU - Watanabe, S.

AU - Hane, K.

AU - Ito, M.

AU - Goto, T.

PY - 1993

Y1 - 1993

N2 - In this letter, a variant of scanning force microscope for detecting attractive forces is reported. The force gradients of the attractive forces acting in two orthogonal directions were detected simultaneously from the resonant frequency shifts of a cantilever oscillating in two directions. Using the fine electrode sample, the distributions of the electrostatic forces acting in lateral and vertical directions were visualized separately.

AB - In this letter, a variant of scanning force microscope for detecting attractive forces is reported. The force gradients of the attractive forces acting in two orthogonal directions were detected simultaneously from the resonant frequency shifts of a cantilever oscillating in two directions. Using the fine electrode sample, the distributions of the electrostatic forces acting in lateral and vertical directions were visualized separately.

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U2 - 10.1063/1.110437

DO - 10.1063/1.110437

M3 - Article

AN - SCOPUS:0011319280

SN - 0003-6951

VL - 63

SP - 2573

EP - 2575

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

ER -

Dynamic mode force microscopy for the detection of lateral and vertical electrostatic forces

Abstract

ASJC Scopus subject areas

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