Effect of additional elements on compositional modulated atomic layered structure of hexagonal Co₈₀Pt₂₀ alloy films with superlattice diffraction

The effect of additional element on compositionally modulated atomic layered structure of hexagonal Co₈₀Pt₂₀ alloy films with superlattice diffraction was investigated. In this study it is found that the addition of Cr or W element to Co₈₀Pt₂₀ alloy film shows less deterioration of hcp stacking structure and compositionally modulated atomic layer stacking structure as compared to Si or Zr or Ti with K_u of around 1.4 or 1.0 × 10⁷ erg/cm³ at 5 at.% addition. Furthermore, for O₂ addition of O₂ ≥ 5.0 × 10^-3 Pa to CoPt alloy, compositionally modulated atomic layer stacking structure will be deteriorated with enhancement of formation of hcp stacking structure which leads higher K_u of 1.0 × 10⁷ erg/cm³.