Effect of Ar-N2 Sputtering Gas on Structure and Tunneling Magnetodielectric Effect in Co-(Si-N) Nanogranular Films

T. Uchiyama, Y. Cao, H. Kijima-Aoki, K. Ikeda, N. Kobayashi, S. Ohnuma, H. Masumoto

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

We have investigated the effect of N2 fraction x in Ar-N2 sputtering gas on the tunneling magnetodielectric (TMD) effect in Co-(Si-N) nanogranular films. Co-(Si-N) films were deposited by co-sputtering Co and Si3N4 targets in Ar- x vol.%N2 mixture gas with different N2 gas fractions x of 0-30. All deposited films had a nanogranular structure composed of Co nanogranules with a diameter of 1-3 nm embedded in a Si-N matrix. We realized the TMD effect in the films for x ≥3.3 , and the film deposited in Ar-6.6 vol.%N2 gas showed the highest dielectric variations in a magnetic field. For 3.3≤ x ≤10 , TMD peak frequency f_ TMD decreased from 17 to 40 kHz with increasing x because of the increase in intergranular spacing s. On the other hand, for 10 < x ≤30 , f_ TMD increased from 40 kHz to 3.3 MHz as x increased since both s in the out-of-plane direction and \beta , which indirectly represents the measure of the distribution of s , decreased. This study provides a new way to tailor the frequency response of the TMD effect.

Original languageEnglish
Article number2800705
JournalIEEE Transactions on Magnetics
Volume59
Issue number11
DOIs
Publication statusPublished - 2023 Nov 1

Keywords

  • Cobalt-silicon nitride
  • nanogranular film
  • sputtering method
  • tunnel magnetodielectric effect

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