Effect of DC bias current on sensitivity of thin-film magnetoimpedance element

C. Sumida; H. Kikuchi; S. Hashi; K. Ishiyama; T. Nakai

doi:10.1109/INTMAG.2017.8007906

Effect of DC bias current on sensitivity of thin-film magnetoimpedance element

C. Sumida, H. Kikuchi, S. Hashi, K. Ishiyama, T. Nakai

RIEC - Human and Bio Information Systems Division

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Magnetoimpedance (MI) sensor is commercially applied for compasses in mobile phones [1], and its sensitivity has been enhanced to be applicable to biomedical research field and nondestructive testing [2].

Original language	English
Title of host publication	2017 IEEE International Magnetics Conference, INTERMAG 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538610862
DOIs	https://doi.org/10.1109/INTMAG.2017.8007906
Publication status	Published - 2017 Aug 10
Event	2017 IEEE International Magnetics Conference, INTERMAG 2017 - Dublin, Ireland Duration: 2017 Apr 24 → 2017 Apr 28

Publication series

Name	2017 IEEE International Magnetics Conference, INTERMAG 2017

Conference

Conference	2017 IEEE International Magnetics Conference, INTERMAG 2017
Country/Territory	Ireland
City	Dublin
Period	17/4/24 → 17/4/28

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10.1109/INTMAG.2017.8007906

Cite this

Sumida, C., Kikuchi, H., Hashi, S., Ishiyama, K., & Nakai, T. (2017). Effect of DC bias current on sensitivity of thin-film magnetoimpedance element. In 2017 IEEE International Magnetics Conference, INTERMAG 2017 Article 8007906 (2017 IEEE International Magnetics Conference, INTERMAG 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INTMAG.2017.8007906

@inproceedings{3eda65970af04b079e5f6bd52169c124,

title = "Effect of DC bias current on sensitivity of thin-film magnetoimpedance element",

abstract = "Magnetoimpedance (MI) sensor is commercially applied for compasses in mobile phones [1], and its sensitivity has been enhanced to be applicable to biomedical research field and nondestructive testing [2].",

author = "C. Sumida and H. Kikuchi and S. Hashi and K. Ishiyama and T. Nakai",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE International Magnetics Conference, INTERMAG 2017 ; Conference date: 24-04-2017 Through 28-04-2017",

year = "2017",

month = aug,

day = "10",

doi = "10.1109/INTMAG.2017.8007906",

language = "English",

series = "2017 IEEE International Magnetics Conference, INTERMAG 2017",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2017 IEEE International Magnetics Conference, INTERMAG 2017",

address = "United States",

}

Sumida, C, Kikuchi, H, Hashi, S, Ishiyama, K & Nakai, T 2017, Effect of DC bias current on sensitivity of thin-film magnetoimpedance element. in 2017 IEEE International Magnetics Conference, INTERMAG 2017., 8007906, 2017 IEEE International Magnetics Conference, INTERMAG 2017, Institute of Electrical and Electronics Engineers Inc., 2017 IEEE International Magnetics Conference, INTERMAG 2017, Dublin, Ireland, 17/4/24. https://doi.org/10.1109/INTMAG.2017.8007906

Effect of DC bias current on sensitivity of thin-film magnetoimpedance element. / Sumida, C.; Kikuchi, H.; Hashi, S. et al.
2017 IEEE International Magnetics Conference, INTERMAG 2017. Institute of Electrical and Electronics Engineers Inc., 2017. 8007906 (2017 IEEE International Magnetics Conference, INTERMAG 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Effect of DC bias current on sensitivity of thin-film magnetoimpedance element

AU - Sumida, C.

AU - Kikuchi, H.

AU - Hashi, S.

AU - Ishiyama, K.

AU - Nakai, T.

PY - 2017/8/10

Y1 - 2017/8/10

N2 - Magnetoimpedance (MI) sensor is commercially applied for compasses in mobile phones [1], and its sensitivity has been enhanced to be applicable to biomedical research field and nondestructive testing [2].

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M3 - Conference contribution

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T3 - 2017 IEEE International Magnetics Conference, INTERMAG 2017

BT - 2017 IEEE International Magnetics Conference, INTERMAG 2017

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2017 IEEE International Magnetics Conference, INTERMAG 2017

Y2 - 24 April 2017 through 28 April 2017

ER -

Effect of DC bias current on sensitivity of thin-film magnetoimpedance element

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