Abstract
Ti-Ni-Cu/SiO2 two layer diaphragm-type microactuators were fabricated by sputter deposition and micromachining. The influence of heat treatment temperature on the actuation behavior was investigated under quasi-static conditions. The interfacial structure of Ti- Ni-Cu/SiO2 and internal structure of the Ti-Ni-Cu layer were also investigated using transmission electron microscopy. The reaction layer formed between the Ti-Ni-Cu and SiO2 layers, and preferentially grew into the SiO2 side. The reaction layer formed at 1023 K mainly consisted of Ti 4(Ni,Cu)2O. The maximum height of the diaphragm decreased with increasing heat treatment temperature. The growth of the reaction layer also affected the microstructure of the Ti-Ni-Cu layer. The density of fine platelets and Ti2Ni precipitates decreased with increasing heat treatment temperature from 873 to 923 K, and they disappeared at 973 K due to the fact that the reaction layer mainly consisted of a Ti-rich phase. The microactuator heat treated at 973 K showed the highest transformation temperature with the lowest transformation temperature hysteresis, which is attractive for high speed actuation.
Original language | English |
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Pages (from-to) | 6064-6071 |
Number of pages | 8 |
Journal | Acta Materialia |
Volume | 58 |
Issue number | 18 |
DOIs | |
Publication status | Published - 2010 Oct |
Externally published | Yes |
Keywords
- Microactuator
- Shape memory effect
- Thin film
- Ti-Ni-Cu
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Polymers and Plastics
- Metals and Alloys