Effect of hole-injection layer on top-gate organic field-effect transistors based on soluble benzothienobenzothiophene derivatives

Fumio Mochizuki, Yosuke Miyata, Takashi Nagase, Takashi Kobayashi, Kazuo Takimiya, Masaaki Ikeda, Hiroyoshi Naito

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Effect of MoO3 hole-injection layers on the electrical characteristics of top-gate Ce-BTBT OFETs has been investigated. The field-effect mobility of short-channel devices is improved by inserting 1-nm-thick M0O3 layers, as a result of the decrease in contact resistance. The dependence of the electrical characteristics on M0O3 thickness is also investigated.

Original languageEnglish
Title of host publicationSociety for Information Display - 19th International Display Workshops 2012, IDW/AD 2012
Pages1022-1025
Number of pages4
Publication statusPublished - 2012
Event19th International Display Workshops in Conjunction with Asia Display 2012, IDW/AD 2012 - Kyoto, Japan
Duration: 2012 Dec 42012 Dec 7

Publication series

NameProceedings of the International Display Workshops
Volume2
ISSN (Print)1883-2490

Conference

Conference19th International Display Workshops in Conjunction with Asia Display 2012, IDW/AD 2012
Country/TerritoryJapan
CityKyoto
Period12/12/412/12/7

Keywords

  • C-BTBT
  • MoO
  • Organic field-effect transistors
  • Short-channel effect

Fingerprint

Dive into the research topics of 'Effect of hole-injection layer on top-gate organic field-effect transistors based on soluble benzothienobenzothiophene derivatives'. Together they form a unique fingerprint.

Cite this