TY - JOUR
T1 - Effect of Rh spacer on synthetic-antiferromagnetic coupling in FeCoB/Rh/FeCoB films
AU - Xia, W. X.
AU - Inoue, K.
AU - Saito, S.
AU - Takahashi, M.
PY - 2011
Y1 - 2011
N2 - Effect of Rh spacer on synthetic antiferromagnetic (SAF) coupling was investigated in subnano-crystalline (Fe65Co35) 88B12 (30 nm)/ Rh/ (Fe65Co35) 88B12 (30 nm) films. The flopping field (Hf) showed oscillatory behavior with respect to Rh thickness, dRh. The 1st peak of Hf appeared at dRh 0.9 nm, and the 2nd at dRh 1.7 nm. These results are analyzed in terms of interlayer coupling effect including the bilinear (J1) and biquadratic (J 2) coupling energy, and found to be 0.65 erg/cm2 for J1 and 0.12 erg/cm2 for J2 at the 1st peak. Compared to SAF coupling with Ru spacer, the 1st peak thickness with Rh spacer is thicker. This is because the effective spacer layer thickness decreases by the polarization of Rh neighboring FeCo based material.
AB - Effect of Rh spacer on synthetic antiferromagnetic (SAF) coupling was investigated in subnano-crystalline (Fe65Co35) 88B12 (30 nm)/ Rh/ (Fe65Co35) 88B12 (30 nm) films. The flopping field (Hf) showed oscillatory behavior with respect to Rh thickness, dRh. The 1st peak of Hf appeared at dRh 0.9 nm, and the 2nd at dRh 1.7 nm. These results are analyzed in terms of interlayer coupling effect including the bilinear (J1) and biquadratic (J 2) coupling energy, and found to be 0.65 erg/cm2 for J1 and 0.12 erg/cm2 for J2 at the 1st peak. Compared to SAF coupling with Ru spacer, the 1st peak thickness with Rh spacer is thicker. This is because the effective spacer layer thickness decreases by the polarization of Rh neighboring FeCo based material.
UR - http://www.scopus.com/inward/record.url?scp=79952030677&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79952030677&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/266/1/012064
DO - 10.1088/1742-6596/266/1/012064
M3 - Article
AN - SCOPUS:79952030677
SN - 1742-6588
VL - 266
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012064
ER -