TY - GEN
T1 - Effects of metal buffer layer on the morphology of the ZnO columns
AU - Feng, Xia
AU - Yuan, Xiaoli
AU - Sekiguchi, Takashi
AU - Terauchi, Masami
AU - Tsunekawa, Shin
AU - Ito, Shun
AU - Kang, Junyong
PY - 2005
Y1 - 2005
N2 - ZnO columns with different morphologies were grown on Au- and Cu-buffer layers deposited on Si substrates. This indicates that the metal buffer layer will affect the growth rates along different directions. The theoretical calculation shows that O atoms are favourably adsorbed on the hcp sites on both the Au (111) and the Cu (111) surfaces. However, the adsorbed Zn atoms are stabilized on the top site of the O atoms on the Au surface while they are favorable on the fee sites on the Cu surface. This suggests that the different morphologies initiate from the different adsorption sites of Zn atoms on the two metal surfaces.
AB - ZnO columns with different morphologies were grown on Au- and Cu-buffer layers deposited on Si substrates. This indicates that the metal buffer layer will affect the growth rates along different directions. The theoretical calculation shows that O atoms are favourably adsorbed on the hcp sites on both the Au (111) and the Cu (111) surfaces. However, the adsorbed Zn atoms are stabilized on the top site of the O atoms on the Au surface while they are favorable on the fee sites on the Cu surface. This suggests that the different morphologies initiate from the different adsorption sites of Zn atoms on the two metal surfaces.
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U2 - 10.1109/SIM.2005.1511407
DO - 10.1109/SIM.2005.1511407
M3 - Conference contribution
AN - SCOPUS:33746604818
SN - 078038668X
SN - 9780780386686
T3 - IEEE Semiconducting and Semi-Insulating Materials Conference, SIMC
SP - 156
EP - 159
BT - 2004 13th International Conference on Semiconducting and Insulating Materials, SIMC-XIII-2004
T2 - 2004 13th International Conference on Semiconducting and Insulating Materials, SIMC-XIII-2004
Y2 - 20 September 2004 through 25 September 2004
ER -