TY - JOUR
T1 - Effects of mixing germane in silane gas-source molecular beam epitaxy
AU - Kim, Ki Joon
AU - Suemitsu, Maki
AU - Yamanaka, Masayoshi
AU - Miyamoto, Nobuo
N1 - Copyright:
Copyright 2007 Elsevier B.V., All rights reserved.
PY - 1993
Y1 - 1993
N2 - Growth of SiGe gas-source molecular beam epitaxy (GSMBE) using silane/germane mixture has been investigated for the germane content of 0%, 0.8%, and 2.6%. From detailed measurements on the growth rate, a separation into high- and low-temperature regions of the growth rate, as in silane-GSMBE system, has been found to exist in this silane/germane system. A simultaneous measurement on the surface hydrogen coverage has revealed that the growth in the low-temperature region is rate limited by the surface hydrogen desorption process, reasoning the enhanced growth rate with germane in terms of the reduced coverage of the surface hydrogen. All the growth rates followed a same fourth power dependence on the free-adsorption site, which suggests a validity of the four-site adsorption model, established for silane-GSMBE, in silane/germane GSMBE.
AB - Growth of SiGe gas-source molecular beam epitaxy (GSMBE) using silane/germane mixture has been investigated for the germane content of 0%, 0.8%, and 2.6%. From detailed measurements on the growth rate, a separation into high- and low-temperature regions of the growth rate, as in silane-GSMBE system, has been found to exist in this silane/germane system. A simultaneous measurement on the surface hydrogen coverage has revealed that the growth in the low-temperature region is rate limited by the surface hydrogen desorption process, reasoning the enhanced growth rate with germane in terms of the reduced coverage of the surface hydrogen. All the growth rates followed a same fourth power dependence on the free-adsorption site, which suggests a validity of the four-site adsorption model, established for silane-GSMBE, in silane/germane GSMBE.
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U2 - 10.1063/1.109049
DO - 10.1063/1.109049
M3 - Article
AN - SCOPUS:0012780804
SN - 0003-6951
VL - 62
SP - 3461
EP - 3463
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 26
ER -