Abstract
The mechanism of film growth of CoCr intermediate layer and CoCrPtB magnetic layer was studied by analyzing the thickness dependence of in plane x-ray diffraction (XRD) profiles and perpendicular magnetic anisotropy. The in-plane XRD profiles of intermediate layers were observed at various substrate temperature. Cr-rich hcp phase was formed in the films fabricated at 250 °C. The hcp phase was decomposed into Cr-less hcp phase with further increase in temperature.
Original language | English |
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Pages (from-to) | FQ06 |
Journal | Digests of the Intermag Conference |
Publication status | Published - 2002 |
Event | 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2 |